電子高低溫循環試驗箱適用(yong)于檢(jian)測電(dian)子(zi)、電(dian)子(zi)產品(pin)(pin)、電(dian)子(zi)元件(jian)、電(dian)路板(ban)、線路板(ban)、PCB板(ban)、FPC電(dian)路板(ban)、電(dian)工(gong)、電(dian)腦(nao)、光電(dian)、光纖、光伏(fu)組件(jian)、LED、LCD、IC、電(dian)器(qi)、汽車配件(jian)、化工(gong)、涂料、各(ge)種(zhong)電(dian)子(zi)元器(qi)件(jian)及其他(ta)相關(guan)產品(pin)(pin)零部件(jian)在通電(dian)使(shi)(shi)用(yong)測試(shi)其耐(nai)高(gao)溫（高(gao)溫試(shi)驗(yan)）、耐(nai)低溫（低溫試(shi)驗(yan)）耐(nai)高(gao)低溫交變（高(gao)低溫循環試(shi)驗(yan)）環境下貯存、運輸、使(shi)(shi)用(yong)時的適應性試(shi)驗(yan)，考核其各(ge)項性能(neng)指標。

符合標準：

GJB150.3 高溫試(shi)驗

GJB150.4 低溫試驗

GB11158 高溫試驗箱技術條(tiao)件

GB10589 低(di)溫(wen)試驗箱技(ji)術(shu)條件

GB10592-89 高(gao)低溫試驗箱技術條件

GB/T2423.1-2001 低溫(wen)試驗(yan)箱試驗(yan)方法

GB/T2423.2-2001 高溫試(shi)驗(yan)箱試(shi)驗(yan)方(fang)法

GB/T2423.22-2001 溫(wen)度(du)變化試驗方(fang)法

IEC60068-2-1.1990 低溫試(shi)驗(yan)箱試(shi)驗(yan)方法

IEC60068-2-2.1974 高溫(wen)試驗箱試驗方法

電子高低溫循環試驗箱技(ji)術(shu)參數(shu)、型號(hao)規格表：

科文試(shi)驗(yan)(yan)(yan)(yan)(yan)設(she)備有(you)限公(gong)司專業生產銷售：高(gao)低(di)(di)溫(wen)循環(huan)試(shi)驗(yan)(yan)(yan)(yan)(yan)箱(xiang)、高(gao)低(di)(di)溫(wen)恒(heng)溫(wen)箱(xiang)、高(gao)低(di)(di)溫(wen)箱(xiang)、高(gao)低(di)(di)溫(wen)交變濕熱試(shi)驗(yan)(yan)(yan)(yan)(yan)箱(xiang)、高(gao)溫(wen)烤箱(xiang)、恒(heng)溫(wen)恒(heng)濕試(shi)驗(yan)(yan)(yan)(yan)(yan)箱(xiang)、電(dian)熱鼓(gu)風干燥(zao)箱(xiang)、冷熱沖(chong)擊試(shi)驗(yan)(yan)(yan)(yan)(yan)箱(xiang)、砂塵試(shi)驗(yan)(yan)(yan)(yan)(yan)箱(xiang)、淋雨試(shi)驗(yan)(yan)(yan)(yan)(yan)箱(xiang)、氙燈耐(nai)(nai)氣候(hou)試(shi)驗(yan)(yan)(yan)(yan)(yan)箱(xiang)、紫外(wai)線(xian)耐(nai)(nai)氣候(hou)試(shi)驗(yan)(yan)(yan)(yan)(yan)箱(xiang)、振(zhen)動試(shi)驗(yan)(yan)(yan)(yan)(yan)臺、跌落試(shi)驗(yan)(yan)(yan)(yan)(yan)臺、老(lao)化房、鹽霧腐蝕(shi)試(shi)驗(yan)(yan)(yan)(yan)(yan)箱(xiang)、紙(zhi)業包裝用試(shi)驗(yan)(yan)(yan)(yan)(yan)設(she)備、拉力及電(dian)子線(xian)材試(shi)驗(yan)(yan)(yan)(yan)(yan)機、手機筆記本檢測設(she)備等產品，并(bing)竭誠(cheng)為廣(guang)大(da)用戶(hu)研制特(te)殊方案的試(shi)驗(yan)(yan)(yan)(yan)(yan)設(she)備。